4

Highly oriented ZnO films obtained by d.c. reactive sputtering of a zinc target

Year:
1984
Language:
english
File:
PDF, 933 KB
english, 1984
6

Change in the structure of sputtered SnO2 films during annealing

Year:
1984
Language:
english
File:
PDF, 59 KB
english, 1984
13

Extractive Spectrophotometric Determination of Chlorprothixene Hydrochloride

Year:
2000
Language:
english
File:
PDF, 392 KB
english, 2000
14

SPECTROPHOTOMETRIC DETERMINATION OF SOME ANTIDEPRESSANT DRUGS

Year:
2002
Language:
english
File:
PDF, 264 KB
english, 2002
18

Structure of Oxygen and Silicon Interstitials in Silicon

Year:
1999
Language:
english
File:
PDF, 110 KB
english, 1999
19

Effect of Stress on Creation of Defects in Annealed Czochralski Grown Silicon

Year:
1999
Language:
english
File:
PDF, 167 KB
english, 1999
27

Growth of USb2 single crystals and their structural perfection

Year:
1979
Language:
english
File:
PDF, 758 KB
english, 1979
31

Pressure assisted evolution of defects in silicon

Year:
2003
Language:
english
File:
PDF, 61 KB
english, 2003
37

The optimal temperature profile in crystal growth from the vapour

Year:
1995
Language:
english
File:
PDF, 368 KB
english, 1995
45

Stress dependent structure of annealed nitrogen-doped Cz-Si

Year:
2006
Language:
english
File:
PDF, 217 KB
english, 2006